Please use this identifier to cite or link to this item: https://une.intersearch.com.au/unejspui/handle/1959.11/3478
Title: High-resolution X-ray diffractometry investigation of interface layers in GaN/AlN structures grown on sapphire substrates
Contributor(s): Mudie, Stephen T (author); Pavlov, Konstantin M  (author)orcid ; Morgan, Michael J (author); Tabuchi, Masao (author); Takeda, Yoshikazu (author); Hester, James (author)
Publication Date: 2003
DOI: 10.1142/S0218625X03005001
Handle Link: https://hdl.handle.net/1959.11/3478
Abstract: GaInN is an important wide band gap material with applications in short wavelength optoelectronic devices. The GaInN layer is often grown on a sapphire substrate, with low-temperature-deposited AlN and thick GaN used as buffer layers. The growth regime consists of many steps, each of which contributes to the overall properties of the device. The aim of our high-resolution X-ray diffraction experiments, conducted at the Photon Factory (Tsukuba, Japan), was to investigate the structural quality of the AlN buffer layer, which affects the final properties of the device. Reciprocal space mapping was used to study samples (having various layer thicknesses) from each stage of the growth process. Analysis of the experimental data provides parameters such as mosaic block dimensions and orientation, lattice strain distribution, and layer thickness.
Publication Type: Journal Article
Source of Publication: Surface Review and Letters, 10(2-3), p. 513-517
Publisher: World Scientific Publishing Co Pte Ltd
Place of Publication: Singapore
ISSN: 0218-625X
1793-6667
Field of Research (FOR): 110320 Radiology and Organ Imaging
020406 Surfaces and Structural Properties of Condensed Matter
Peer Reviewed: Yes
HERDC Category Description: C1 Refereed Article in a Scholarly Journal
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